FACILITIES
EQUIPMENT LIST
LOAD Frames
CRITERION C43.104E Tall Dual Column 10kN Frame:
- Force Capacity: 10 kN (2.2 kip)
- Max Speed: 2000 mm/min (78.7 in/min)
- Tabletop configuration
- Vertical Test Space: 1500 mm (59.1 in)
- Distance Between Columns: 425 mm (16.7 in)
- 12,000 RPM
- 115 Volts
- 60 Hz
- 6.3 A
Psylotech’s μTS is specifically designed to keep a sample in- plane during testing. The result is a sophisticated instrument well suited for:
• Continuum Model Validation of finite element analysis through multi-scale testing
• Miniature Sample Testing to facilitate material development where quantities can be low
• Unprecedented Versatility to enable implementation of new experimental techniques
Psylotech’s μTS includes a wide range of features which separate it from any other under-microscope system currently on the market today. These features allow for new possibilities in material testing applications in addition to novel experimental techniques. Such as -Large Grip Variety
Max Loading: +/- 220N, 45N, or 10N
Max Displacement: 13 mm
Max Frequency: 300Hz
Temperature Range: -150 to 315°C
Aluminum bar max speed: 60 ft/s
Steel Bar max speed: 100 ft/s
Incident/Transmission Bar Diameter: 0.75 in
Thermal Loading
ATS 3210
Max Temp: 2000°F
ATS 3710
Max Temp: 800°F
Diagnostic Equipment
Measures and visualizes full-field, 3-Dimensional measurements of shape, displacement, and strain on a surface
Measures displacements down to nanometer resolution (dependent upon the size of the object),
Strains from 100 microstrain to 2000% and above are possible with down to 50 microstrain resolution.
Simple system setup, requires a quick calibration procedure and an applied random speckle pattern.
No special illumination or lasers required and there is no contact with the specimen during testing.
Pattern Preparation Area:
- Field of view (zoom range): 0.8mm-7mm
- Full-field measurements of 3D coordinates, displacements, velocities, and complete strain tensors
- Automatic calibration
- Image pairs can be automatically overlapped with a simple adjustment
- Powerful tools for visualizing data
- Contour displays which can be overlaid onto images of the test specimen
- Data extraction from 3D plots based on user defined lines and circles
- Post-processing tools for statistical analysis, stress-strain curves, and more
- Convenient exporting of data with the FLEXPortTM data tool
- Data can be exported in Tecplot/plain ASCII, Matlab, and STL formats
- Node data can be easily extracted for FEA validation
Max Frame Rate: 275,000 fps at 1024 x 8 pixels
Max Resolution: 1200 fps at 4096 x 2304 pixels
Pixel size: 10 µm x 10 µm
Sensor Size: 28.96 mm
Specification Telops FAST M100hd
Detector type InSb
Internal High-Speed Memory 16 GB
Spectral resolution 1280 × 1024 pixels
Pixel Pitch 10 μm
Spectral range 1.5 to 5.4 μm
Optical aperture F/3
Typical NETD 30 mK
Maximum frame rate @ 320×256 335 Hz
Maximum frame rate @ 1280 x 1024 100 Hz
Operational Environment -15°C to +50°C
Storage Environment -35°C to + 60°C
Calibration maximum 2500°C
Sample Preparation
The GIGA-1200 is designed to prepare even the most difficult to polish materials with a very gentle polishing action. Polishing is accomplished by setting the default frequency so that the sample begins to vibrate and then changing the voltage in order to adjust the rotational speed. The GIGA-1200 features an interchangeable polishing bowl and a variety of specimen holders and weight (quoted separately), FRP hood, heavy duty aluminum casting base, acrylic cover and durable plastic bowl.
Low/Medium Speed Precision Cutting Saw
• Internal coolant pump and Digital feedback speed control. Ideal for all materials and User friendly
• Variable wheel speeds from 50- 1500 rpm with digital feedback for constant speed control
• Accepts thin 3 (75 mm) to 7-inch 175 mm) wafering blade diameters •Capable of using 6 and 7-inch abrasive blades with 1/2-inch arbor (12.5 mm)
• Built-in digital micrometer
Layout
